Prevention in a Chip of EMI Noise Caused by X'tal Oscillator

Hiroshi FUJITA
Tetsuya IBE

IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E91-A    No.4    pp.1077-1083
Publication Date: 2008/04/01
Online ISSN: 1745-1337
DOI: 10.1093/ietfec/e91-a.4.1077
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on Selected Papers from the 20th Workshop on Circuits and Systems in Karuizawa)
EMI,  crystal oscillator,  noise,  decoupling capacitor,  

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Developing LSIs with EMI suppression, particularly for use in automobiles, is important for improving warranties and customer acquisition. First, we describe that the measures against EMI noise caused by a X'tal oscillator are important. Next, we present a practical method for analyzing the noise with models of the inside and outside of a chip. In addition, we propose a within-chip measure against EMI noise that takes chip cost into account. The noise is suppressed by using an appropriate resistance and capacitance on the power line. Simulation results demonstrated the method's effectiveness in suppressing noise.