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Detection of CMOS Open Node Defects by Frequency Analysis
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/03/01
Online ISSN: 1745-1361
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Dependable Computing
current test, open node defect, floating gate defect, frequency analysis,
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A method to detect open node defects that cannot be detected by the conventional IDDQ test method has previously been proposed employing a sinusoidal wave superposed on the DC supply voltage. The present paper proposes a strategy to improve the detectability of the test method by means of frequency analysis of the supply current. In this strategy, defects are detected by determining whether secondary harmonics of the sinusoidal wave exist in the supply current. The effectiveness of the method is confirmed by experiments on two CMOS NAND gate packages (SSIs).