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A Mixed Circuit and System Level Simulation Technique of Collision-Resistant RFID System
Yohei FUKUMIZU Naoki GOCHI Makoto NAGATA Kazuo TAKI
IEICE TRANSACTIONS on Electronics
Publication Date: 2007/06/01
Online ISSN: 1745-1353
Print ISSN: 0916-8516
Type of Manuscript: Special Section LETTER (Special Section on Analog Circuits and Related SoC Integration Technologies)
RFID, anti-collision, TH-CDMA, integrated multi-level simulation environment, behavioral modeling, Verilog-AMS,
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An integrated multi-level simulation environment is developed for a highly collision-resistant RFID system. An analog/mixed-signal (AMS) simulator for a circuit-level description of analog front-end power/signal transmission through electro-magnetic coupling is concurrently connected to a tailored software simulator for system-level description of digital back-end processing of TH-CDMA based anti-collision communication. The feasibility of the RFID system in which more than 1,000 transponders can be identified by a single reader in 400 msec is successfuly explored, under a practical presence of field disturbances such as background noises in communication channels as well as variations of electro-magnetic coupling strengths for power transmission.