A Low Power Deterministic Test Using Scan Chain Disable Technique

Zhiqiang YOU  Tsuyoshi IWAGAKI  Michiko INOUE  Hideo FUJIWARA  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E89-D   No.6   pp.1931-1939
Publication Date: 2006/06/01
Online ISSN: 1745-1361
DOI: 10.1093/ietisy/e89-d.6.1931
Print ISSN: 0916-8532
Type of Manuscript: PAPER
Category: Dependable Computing
Keyword: 
low power testing,  full scan testing,  deterministic test,  scan chain disable,  tabu search algorithm,  

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Summary: 
This paper proposes a low power scan test scheme and formulates a problem based on this scheme. In this scheme the flip-flops are grouped into N scan chains. At any time, only one scan chain is active during scan test. Therefore, both average power and peak power are reduced compared with conventional full scan test methodology. This paper also proposes a tabu search-based approach to minimize test application time. In this approach we handle the information during deterministic test efficiently. Experimental results demonstrate that this approach drastically reduces both average power and peak power dissipation at a little longer test application time on various benchmark circuits.