IEICE Trans - Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree

Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree

Gang ZENG  Hideo ITO

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E89-D   No.3   pp.1157-1164
Publication Date: 2006/03/01
Online ISSN: 1745-1361
DOI: 10.1093/ietisy/e89-d.3.1157
Print ISSN: 0916-8532
Type of Manuscript: PAPER
Category: Dependable Computing
Keyword:
concurrent testing,  SOC testing,  test cost reduction,  test data compression,

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Summary:
A novel concurrent core test approach is proposed to reduce the test cost of SOC. Prior to test, the test sets corresponding to cores under test (CUT) are merged by using the proposed merging algorithm to obtain a minimum merged test set. During test, the proposed scan tree architecture is employed to support the concurrent core test using the merged test set. The approach achieves concurrent core test with one scan input and low hardware overhead. Moreover, the approach does not need any additional test generation, and it can be used in conjunction with general compression/decompression techniques to further reduce test cost. Experimental results for ISCAS 89 benchmarks have proven the efficiency of the proposed approach.