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Pairwise Test Case Generation Based on Module Dependency
Jangbok KIM Kyunghee CHOI Gihyun JUNG
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/11/01
Online ISSN: 1745-1361
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Software Engineering
Pairwise, module dependency, software test,
Full Text: PDF(112.2KB)>>
This letter proposes a modified Pairwise test case generation algorithm. The proposed algorithm produces additional test cases that may not be covered by Pairwise algorithm due to the dependency between internal modules of software systems. The algorithm produces additional cases utilizing internal module dependencies. The algorithm effectively increases the coverage of testing without significantly increasing the number of test cases.