Pairwise Test Case Generation Based on Module Dependency

Jangbok KIM  Kyunghee CHOI  Gihyun JUNG  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E89-D   No.11   pp.2811-2813
Publication Date: 2006/11/01
Online ISSN: 1745-1361
DOI: 10.1093/ietisy/e89-d.11.2811
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Software Engineering
Keyword: 
Pairwise,  module dependency,  software test,  

Full Text: PDF(112.2KB)>>
Buy this Article




Summary: 
This letter proposes a modified Pairwise test case generation algorithm. The proposed algorithm produces additional test cases that may not be covered by Pairwise algorithm due to the dependency between internal modules of software systems. The algorithm produces additional cases utilizing internal module dependencies. The algorithm effectively increases the coverage of testing without significantly increasing the number of test cases.