A Per-Test Fault Diagnosis Method Based on the X-Fault Model

Xiaoqing WEN  Seiji KAJIHARA  Kohei MIYASE  Yuta YAMATO  Kewal K. SALUJA  Laung-Terng WANG  Kozo KINOSHITA  

IEICE TRANSACTIONS on Information and Systems   Vol.E89-D    No.11    pp.2756-2765
Publication Date: 2006/11/01
Online ISSN: 1745-1361
DOI: 10.1093/ietisy/e89-d.11.2756
Print ISSN: 0916-8532
Type of Manuscript: PAPER
Category: Dependable Computing
fault diagnosis,  per-test,  X-fault model,  

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This paper proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model can represent all possible faulty behaviors of a physical defect or defects in a gate and/or on its fanout branches by assigning different X symbols assigned to the fanout branches. A partial symbolic fault simulation method is proposed for the X-fault model. Then, a novel technique is proposed for extracting more diagnostic information by analyzing matching details between observed and simulated responses. Furthermore, a unique method is proposed to score the results of fault diagnosis. Experimental results on benchmark circuits demonstrate the superiority of the proposed method over conventional per-test fault diagnosis based on the stuck-at fault model.

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