For Full-Text PDF, please login, if you are a member of IEICE,|
or go to Pay Per View on menu list, if you are a nonmember of IEICE.
A Per-Test Fault Diagnosis Method Based on the X-Fault Model
Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Yuta YAMATO Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/11/01
Online ISSN: 1745-1361
Print ISSN: 0916-8532
Type of Manuscript: PAPER
Category: Dependable Computing
fault diagnosis, per-test, X-fault model,
Full Text: PDF>>
This paper proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model can represent all possible faulty behaviors of a physical defect or defects in a gate and/or on its fanout branches by assigning different X symbols assigned to the fanout branches. A partial symbolic fault simulation method is proposed for the X-fault model. Then, a novel technique is proposed for extracting more diagnostic information by analyzing matching details between observed and simulated responses. Furthermore, a unique method is proposed to score the results of fault diagnosis. Experimental results on benchmark circuits demonstrate the superiority of the proposed method over conventional per-test fault diagnosis based on the stuck-at fault model.