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A CMOS Built-In Current Sensor for IDDQ Testing
Jeong Beom KIM Seung Ho HONG
IEICE TRANSACTIONS on Electronics
Publication Date: 2006/06/01
Online ISSN: 1745-1353
Print ISSN: 0916-8516
Type of Manuscript: LETTER
Category: Integrated Electronics
IDDQ testing, current testing, BICS, reliability,
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This paper presents a new built-in current sensor (BICS) that detects defects using the current testing technique in CMOS integrated circuits. The proposed circuit is a negligible impact on the performance of the circuit under test (CUT). In addition, no extra power dissipation and high-speed fault detection are achieved. It can be applicable in deep sub-micron process. The area overhead of the BICS versus the entire chip is about 9.2%. The chip was fabricated with Hynix 0.35 µm standard CMOS technology.