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Channel-Count-Independent BIST for Multi-Channel SerDes
Kouichi YAMAGUCHI Muneo FUKAISHI
IEICE TRANSACTIONS on Electronics
Publication Date: 2006/03/01
Online ISSN: 1745-1353
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era)
Category: Interface and Interconnect Techniques
SerDes, BIST, at-speed testing, PRBS, multi-channel synchronization,
Full Text: PDF(657.5KB)>>
This paper describes a BIST circuit for testing SoC integrated multi-channel serializer/deserializer (SerDes) macros. A newly developed packet-based PRBS generator enables the BIST to perform at-speed testing of asynchronous data transfers. In addition, a new technique for chained alignment checks between adjacent channels helps achieve a channel-count-independent architecture for verification of multi-channel alignment between SerDes macros. Fabricated in a 0.13-µm CMOS process and operating at > 500 MHz, the BIST has successfully verified all SerDes functions in at-speed testing of 5-Gbps20-ch SerDes macros.