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Fault Tolerant Dynamic Reconfigurable Device Based on EDAC with Rollback
Kentaro NAKAHARA Shin'ichi KOUYAMA Tomonori IZUMI Hiroyuki OCHI Yukihiro NAKAMURA
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/12/01
Online ISSN: 1745-1337
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: VLSI Architecture
fault tolerance, dependable, dynamic reconfigurable,
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Reconfigurable devices are expected to be utilized in such mission-critical fields as space development and undersea cables, because system updates and pseudo-repair can be achieved remotely by reconfiguring. However, conventional reconfigurable devices suffer from memory-bit upset caused by charged particles in space which results in fatal system problems. In this paper, we propose an architecture of a fault-tolerant reconfigurable device. The proposed device is divided into "autonomous-repair cells" with embedded control circuits. The autonomous-repair cell proposed in this paper is based on error detection and correction (EDAC) and uses hardware and time redundancy. From evaluation, it is shown that the proposed architecture achieves sufficient reliability against configuration memory upset. Trade-offs between performance and cost are also analyzed.