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Interconnect RL Extraction Based on Transfer Characteristics of Transmission-Line
Akira TSUCHIYA Masanori HASHIMOTO Hidetoshi ONODERA
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/12/01
Online ISSN: 1745-1337
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
parameter extraction, transmission-line, frequency dependence,
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This paper proposes a method to determine a single frequency for interconnect RL extraction. Resistance and inductance of interconnects depend on frequency, and hence the extraction frequency strongly affects the modeling accuracy of interconnects. The proposed method determines an extraction frequency based on the transfer characteristic of interconnects. By choosing the frequency where the transfer characteristic becomes maximum, the extracted RL values achieve the accurate modeling of the waveform. Experimental results show that the proposed method provides accurate transition waveforms over various interconnect topologies.