On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies

Xiaoqing WEN  Seiji KAJIHARA  Hideo TAMAMOTO  Kewal K. SALUJA  Kozo KINOSHITA  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E88-D   No.4   pp.703-710
Publication Date: 2005/04/01
Online ISSN: 
DOI: 10.1093/ietisy/e88-d.4.703
Print ISSN: 0916-8532
Type of Manuscript: PAPER
Category: Computer Components
Keyword: 
fault diagnosis,  IDDQ,  transistor leakage fault model,  multiple power supply,  circuit partitioning,  

Full Text: PDF(487.3KB)>>
Buy this Article




Summary: 
This paper presents a novel approach to improving the IDDQ-based diagnosability of a CMOS circuit by dividing the circuit into independent partitions and using a separate power supply for each partition. This technique makes it possible to implement multiple IDDQ measurement points, resulting in improved IDDQ-based diagnosability. The paper formalizes the problem of partitioning a circuit for this purpose and proposes optimal and heuristic based solutions. The effectiveness of the proposed approach is demonstrated through experimental results.