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On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies
Xiaoqing WEN Seiji KAJIHARA Hideo TAMAMOTO Kewal K. SALUJA Kozo KINOSHITA
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/04/01
Print ISSN: 0916-8532
Type of Manuscript: PAPER
Category: Computer Components
fault diagnosis, IDDQ, transistor leakage fault model, multiple power supply, circuit partitioning,
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This paper presents a novel approach to improving the IDDQ-based diagnosability of a CMOS circuit by dividing the circuit into independent partitions and using a separate power supply for each partition. This technique makes it possible to implement multiple IDDQ measurement points, resulting in improved IDDQ-based diagnosability. The paper formalizes the problem of partitioning a circuit for this purpose and proposes optimal and heuristic based solutions. The effectiveness of the proposed approach is demonstrated through experimental results.