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Huffman-Based Test Response Coding
Hideyuki ICHIHARA Michihiro SHINTANI Tomoo INOUE
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/01/01
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Dependable Computing
Huffman code, test compression, test response, test application time, ATE,
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Test compression / decompression is an efficient method for reducing the test application cost. In this letter we propose a response compression method based on Huffman coding. The proposed method guarantees zero-aliasing and it is independent of the fault model and the structure of a circuit-under-test. Experimental results of the compression ratio and the size of the encoder for the proposed method are presented.