An Effective Built-In Self-Test for Chargepump PLL

Junseok HAN  Dongsup SONG  Hagbae KIM  YoungYong KIM  Sungho KANG  

IEICE TRANSACTIONS on Electronics   Vol.E88-C   No.8   pp.1731-1733
Publication Date: 2005/08/01
Online ISSN: 
DOI: 10.1093/ietele/e88-c.8.1731
Print ISSN: 0916-8516
Type of Manuscript: Special Section LETTER (Special Section on Papers Selected from AP-ASIC 2004)
mixed-signal test,  BIST,  PLL,  

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In order to provide an efficient test method for PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. The new BIST uses the change of phase differences generated by selectively alternating the feedback frequency. It provides an efficient structural test, reduces an area overhead and improves the test accessibility.