Two Dimensional Electric Field Measurement in Microstrip-Line Circuits by Coaxial-Type Probe

Takaharu HIRAOKA  Yoshiaki NEISHI  Tetsuo ANADA  Jui-Pang HSU  

IEICE TRANSACTIONS on Electronics   Vol.E88-C   No.1   pp.77-82
Publication Date: 2005/01/01
Online ISSN: 
DOI: 10.1093/ietele/e88-c.1.77
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Recent Trends of Microwave and Millimeter-Wave Passive Circuit Components and Technologies for Improvement of Characteristics)
microwave,  FD-TD techniques,  probe field mapping,  coaxial probe,  microstrip-line,  measurement,  

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A detailed investigation of the electromagnetic field distributions in high frequency printed circuits and high-speed interconnects is very useful for physical understanding, studies of electromagnetic coupling effects for EMC and EMI and for optimization of electromagnetic circuit designs. The aim of this paper is to show how to measure the electric field distributions in electromagnetic circuits. An electromagnetic analysis for microstrip-line circuits is carried out by using a finite-difference time domain technique and its measurement is carried out by using a small probe antenna. The measurement results are in fairly good agreement with those of the numerical analysis using the FDTD method. Thus, the measurement system offers a valid means for predictions in the theoretical analysis of more complicated discontinuity problems.