Radiated Harmonics Characterization of CMOS Test Chip with On-Chip Decoupling Capacitance

Toshio SUDO  

IEICE TRANSACTIONS on Communications   Vol.E88-B   No.8   pp.3195-3199
Publication Date: 2005/08/01
Online ISSN: 
DOI: 10.1093/ietcom/e88-b.8.3195
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section of 2004 International Symposium on Electromagnetic Compatibility)
Category: Printed Circuit Boards
radiated emission,  on-chip decoupling capacitor,  test chip,  core circuit,  output buffer circuit,  simultaneous switching noise,  

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This paper reports experimental results on far-field radiated emission for different on-chip chip power supply networks. Two types of test chips were developed as noise generators. One was with on-chip decoupling capacitance, and the other was without intentional on-chip decoupling capacitance. They were assembled in a CSP (Chip scale package). The effects of on-chip decoupling capacitance on far-field radiated emission were investigated for the operation of core logic circuits and output buffer circuits. Reduced radiated emission was observed for every harmonics for the operation of core logic circuits by the on-chip decoupling capacitance. While, reduced radiated emission was observed for the even-order harmonics for the operation of output buffer circuits due to the existence of on-chip decoupling capacitance.