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Evaluation of X Architecture Using Interconnect Length Distribution
Hidenari NAKASHIMA Naohiro TAKAGI Junpei INOUE Kenichi OKADA Kazuya MASU
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/12/01
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
X architecture, interconnect length distribution, ILD, Rent's rule, all-directional interconnect,
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In this paper, we propose a new Interconnect Length Distribution (ILD) model to evaluate X architecture. X architecture uses 45-wire orientations in addition to 90-wire orientations, which contributes to reduce the total wire length and the number of vias. In this paper, we evaluated interconnect length distribution of diagonal (45orientations) and all-directional wiring. The average length and the longest length of interconnect are estimated, and 18% reduction in power consumption and 17% improvement in clock frequency can be obtained by the diagonal wiring in the experimental results. The all-directional wiring does not have large advantage as compared the diagonal wiring.