Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration

Yasuo SATO  Iwao YAMAZAKI  Hiroki YAMANAKA  Toshio IKEDA  Masahiro TAKAKURA  Kazuhiko IWASAKI  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E87-D   No.9   pp.2179-2185
Publication Date: 2004/09/01
Online ISSN: 
DOI: 
Print ISSN: 0916-8532
Type of Manuscript: PAPER
Category: Dependable Computing
Keyword: 
diagnosis,  open fault,  coupling effect,  

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Summary: 
Although open defects are hard to diagnose because they are unstable, we developed a technique to diagnose completely open defects. We applied a new "segment model" that takes the coupling effects on a defective node that are caused by neighboring nodes into consideration. This technique is used to focuse not only on the behavior of the defective node, but also on the behavior of other nodes affecting its behavior. We explain the theoretical treatment of our model and present experimental results obtained from an actual chip.