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Fault Diagnosis for RAMs Using Walsh Spectrum
Atsumu ISENO Yukihiro IGUCHI Tsutomu SASAO
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Memory Testing
memory test, diagnosis, BIST, fail-bitmap, Walsh spectrum,
Full Text: PDF(717.5KB)>>
In this paper, we show a method to locate a single stuck-at fault of a random access memory (RAM). From the fail-bitmaps of the RAM, we obtain their Walsh spectrum. For a single stuck-at fault, we show that the fault can be identified and located by using only the 0-th and 1-st coefficients of the spectrum. We also show a circuit to compute these coefficients. The computation time is O(2n), where n is the number of bits in the address of the RAM. The computation time is much shorter than one that uses a logic minimization method.