Analysis and Testing of Bridging Faults in CMOS Synchronous Sequential Circuits

Yukiya MIURA  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E87-D   No.3   pp.564-570
Publication Date: 2004/03/01
Online ISSN: 
DOI: 
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Fault Detection
Keyword: 
bridging faults,  CMOS synchronous sequential circuits,  fault analysis,  testing,  

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Summary: 
In this paper, we analyze behaviors of bridging faults in CMOS synchronous sequential circuits based on transient analysis. From analysis results, we expose dynamic and analog behaviors of the circuit caused by the bridging faults, which are oscillation, asynchronous sequential behavior, IDDT failure and IDDQ failure as well as logic error. In order to detect this kind of fault, we show that not only IDDQ testing but also IDDT testing and logic testing which guarantees correct state transitions are required.