CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component

Hiroyuki MICHINISHI  Tokumi YOKOHIRA  Takuji OKAMOTO  Toshifumi KOBAYASHI  Tsutomu HONDO  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E87-D   No.3   pp.551-556
Publication Date: 2004/03/01
Online ISSN: 
DOI: 
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Fault Detection
Keyword: 
current test,  floating gate defect,  open defect,  defect detection,  

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Summary: 
This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.