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An Accurate and Low-Cost Method for On-Wafer LNA Noise Figure Measurement
Sheng-Yu WEN Guo-Wei HUANG Kun-Ming CHEN
IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
on-wafer, noise figure measurement, low-noise amplifier,
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In this paper, an accurate and low-cost method for on-wafer noise figure measurement, specifically designed for low-noise amplifiers (LNAs), will be proposed. An experiment conducted on a 5 GHz LNA demonstrates that a good agreement can be reached between the measurement result of the proposed method and that of a commercial noise parameter measurement system.