Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films


IEICE TRANSACTIONS on Electronics   Vol.E87-C   No.5   pp.652-656
Publication Date: 2004/05/01
Online ISSN: 
Print ISSN: 0916-8516
Type of Manuscript: INVITED PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
microwave,  millimeter wave,  standardization,  low-loss dielectric,  high-temperature superconductor,  

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The present state of IEC and JIS standards is reviewed on measurement methods of low-loss dielectric and high-tempera-ture superconductor (HTS) materials in the microwave and millimeter wave range. Four resonance methods are discussed actually, that is, a two-dielectric resonator method for dielectric rod measurements, a two-sapphire resonator method for HTS film measurements, a cavity resonator method for microwave measurements of dielectric plates and a cutoff circular waveguide method for millimeter wave measurements of dielectric plates. These methods realize the high accuracy sufficient for measurements of temperature dependence of material properties.