Application of High Quality Built-in Test Using Neighborhood Pattern Generator to Industrial Designs

Kazumi HATAYAMA  Michinobu NAKAO  Yoshikazu KIYOSHIGE  Koichiro NATSUME  Yasuo SATO  Takaharu NAGUMO  

IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E87-A   No.12   pp.3318-3323
Publication Date: 2004/12/01
Online ISSN: 
Print ISSN: 0916-8508
Type of Manuscript: Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
BIST,  test pattern generator,  neighborhood pattern,  LFSR,  reseeding,  

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This letter presents a practical approach for high-quality built-in test using a test pattern generator called neighborhood pattern generator (NPG). NPG is practical mainly because its structure is independent of circuit under test and it can realize high fault coverage not only for stuck-at faults but also for transition faults. Some techniques are also proposed for further improvement in practical applicability of NPG. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.