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Application of High Quality Built-in Test Using Neighborhood Pattern Generator to Industrial Designs
Kazumi HATAYAMA Michinobu NAKAO Yoshikazu KIYOSHIGE Koichiro NATSUME Yasuo SATO Takaharu NAGUMO
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Print ISSN: 0916-8508
Type of Manuscript: Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
BIST, test pattern generator, neighborhood pattern, LFSR, reseeding,
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This letter presents a practical approach for high-quality built-in test using a test pattern generator called neighborhood pattern generator (NPG). NPG is practical mainly because its structure is independent of circuit under test and it can realize high fault coverage not only for stuck-at faults but also for transition faults. Some techniques are also proposed for further improvement in practical applicability of NPG. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.