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A Design Scheme for Delay Testing of Controllers Using State Transition Information
Tsuyoshi IWAGAKI Satoshi OHTAKE Hideo FUJIWARA
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
controller, delay fault, non-scan design, invalid test state and transition generator, at-speed test,
Full Text: PDF(463.8KB)>>
This paper presents a non-scan design scheme to enhance delay fault testability of controllers. In this scheme, we utilize a given state transition graph (STG) to test delay faults in its synthesized controller. The original behavior of the STG is used during test application. For faults that cannot be detected by using the original behavior, we design an extra logic, called an invalid test state and transition generator, to make those faults detectable. Our scheme allows achieving short test application time and at-speed testing. We show the effectiveness of our method by experiments.