For Full-Text PDF, please login, if you are a member of IEICE,|
or go to Pay Per View on menu list, if you are a nonmember of IEICE.
Analysis of Connector Contact Failure
Ji-Gao ZHANG Jin-Chun GAO Xue-Yan LIN
IEICE TRANSACTIONS on Electronics
Publication Date: 2003/06/01
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Recent Development of Electro-Mechanical Devices (IS-EMD 2002))
dust contamination, corrosion products, contact failure, error codes,
Full Text: PDF>>
Large number of electronic connectors are widely used in various electronic and telecommunication systems. No matter whether it is optical telecommunications or mobile phone systems, connectors are important links for electronics. Unfortunately connector contacts are exposed in air, they are different from any other electronic components, the contacts are greatly influenced by the environment where they operate. In China, dust and corrosion products are the main contaminants to cause contact failure. Evidently the failed contacts seriously deteriorate the reliability of electronic and telecommunication systems. This paper summarizes the recent achievements obtained by our Lab on the effect of dust and corrosion products to the connector contact failure. Since dust contamination is a very complex problem which is not only popular in China, but also happened in many countries. Continuous studies will be very useful to improve the contact reliability of connectors, setting up new and effective testing methods and standards, building up experimental and computer simulation systems.