Experimental Study on Fully Integrated Active Guard Band Filters for Suppressing Substrate Noise in Sub-Micron CMOS Processes for System-on-a-Chip

Keiko Makie-FUKUDA  Toshiro TSUKADA  

IEICE TRANSACTIONS on Electronics   Vol.E86-C   No.1   pp.89-96
Publication Date: 2003/01/01
Online ISSN: 
Print ISSN: 0916-8516
Type of Manuscript: PAPER
Category: Integrated Electronics
analog and digital mixed-signal integrated circuits,  substrate coupling noise,  noise suppression,  system-on-a-chip,  

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This paper describes fully integrated active guard band filters for suppressing the substrate coupling noise and their noise suppression effect measured by test chip experiments. The noise cancellation circuit of the active guard band filters simply consists of an inverter and a source follower. The substrate noise suppression effect was measured by using a test chip fabricated in a 0.18 µm CMOS triple-well process for system-on-a-chip. The noise with the filter was less than 5% of that without the filter and the noise suppression effect was observed from 1 MHz to 200 MHz by the statistical measurement of the voltage comparator. The noise suppression effect was also observed for actual digital switching noise produced by digital inverters. Configuration of the active guard band filter was investigated by simulation and it is shown that high and uniform noise suppression effect is achieved by placing the guard bands in the L-shape around the target triple-well area on the p-substrate.