Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks

Kazuhiro NOGUCHI  Masafumi KOGA  

Publication
IEICE TRANSACTIONS on Communications   Vol.E86-B   No.5   pp.1530-1538
Publication Date: 2003/05/01
Online ISSN: 
DOI: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Joint Special Issue on Recent Progress in Optoelectronics and Communications)
Category: 
Keyword: 
photonic network,  optical switch,  reliability,  

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Summary: 
Three-dimensional MEMS optical switches(3D-MEMS) and planar lightwave circuit thermo-optical switches (PLC-TOSW) are suitable for use in large-scale photonic cross-connect switches (PXCs). Usually, such large-scale optical switches are created by integrating many small switch elements (such as 12 switches). Therefore, the reliability or lifetime of the individual switch element greatly affects the reliability of the PXC system. In this paper, the effect of the number and failure probability of switch elements on PXC reliability is statistically estimated. First, the equivalent number of switch elements needed to compose a large-scale PXC is determined for the switch types mentioned above. Based on this evaluation, yields and lifetimes of switch modules are estimated for each switch type. The improvement in reliability due to switch duplication (preparing spare switches) is also estimated and discussed.