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Finding All Solutions of Transistor Circuits Using the Dual Simplex Method
Kiyotaka YAMAMURA Osamu NAKAMURA
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/02/01
Print ISSN: 0916-8508
Type of Manuscript: PAPER
Category: Nonlinear Problems
circuit simulation, dc analysis, finding all solutions, transistor circuit,
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An efficient algorithm is proposed for finding all solutions of piecewise-linear resistive circuits containing bipolar transistors. This algorithm is based on a powerful test (termed the LP test) for nonexistence of a solution in a given region using linear programming (LP). In the LP test, an LP problem is formulated by surrounding the exponential functions in the Ebers-Moll model by right-angled triangles, and it is solved by LP, for example, by the simplex method. In this paper, it is shown that the LP test can be performed by the dual simplex method, which makes the number of pivotings much smaller. Effectiveness of the proposed technique is confirmed by numerical examples.