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Deterministic Built-in Test with Neighborhood Pattern Generator
Michinobu NAKAO Yoshikazu KIYOSHIGE Koichiro NATSUME Kazumi HATAYAMA Satoshi FUKUMOTO Kazuhiko IWASAKI
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/05/01
Print ISSN: 0916-8532
Type of Manuscript: PAPER
Category: Fault Tolerance
BIST, test pattern generator, reseeding, bit-flipping, seed generation,
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This paper presents a new deterministic built-in test scheme using a neighborhood pattern generator (NPG) to guarantee complete fault efficiency with small test-data storage. The NPG as a decoding logic generates both a parent pattern and deterministic child patterns within a small Hamming distance from the parent pattern. A set of test cubes is encoded as a set of seeds for the NPG. The proposed method is practically acceptable because no impact on a circuit under test is required and the design of the NPG does not require the results of test generation. We also describe an efficient seed generation method for the NPG. Experimental results for benchmark circuits demonstrate that the proposed method can significantly reduce the storage requirements when compared with other deterministic built-in test methods.