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Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States
Hiroyuki YOTSUYANAGI Masaki HASHIZUME Takeomi TAMESADA
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Print ISSN: 0916-8532
Type of Manuscript: Special Section LETTER (Special Issue on Test and Verification of VLSI)
synthesis for testability, redundancy removal, sequential circuit, undetectable faults, unreachable states,
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A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.