Write Linear Density Limit in Longitudinal Thin Film Media

Jian LI  Xiaobing LIANG  Dan WEI  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E85-C   No.10   pp.1761-1765
Publication Date: 2002/10/01
Online ISSN: 
DOI: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Recent Progress in Information Storage Technology)
Category: 
Keyword: 
longitudinal thin film media,  write linear density limit,  micromagnetic simulation,  

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Summary: 
Write linear density limit is defined to analyze the magnetic recording process in computer hard disk drives at extremely high recording densities. The digital data with pseudo random sequences are recorded numerically in longitudinal media at different densities by a micromagnetic simulation model. A thin film write head and an ideal GMR read head are utilized in the record and read-back process, respectively. A novel method has been utilized to study the write linear density limit: the simulated read back voltage and the respected linear superposed pulses are compared to find the distortion in the record process. When a severe distortion shows up, the corresponding linear density is considered as the write linear density limit. By the novel method, the write linear density limit is analyzed with different parameters of the recording media.