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Ray Tracing Analysis of Large-Scale Random Rough Surface Scattering and Delay Spread
Kwang-Yeol YOON Mitsuo TATEIBA Kazunori UCHIDA
IEICE TRANSACTIONS on Electronics
Publication Date: 2001/02/01
Print ISSN: 0916-8516
Type of Manuscript: LETTER
Category: Electromagnetic Theory
ray tracing method, reflection, diffraction, rough surface,
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We have discussed a ray tracing method to estimate the scattering characteristics from random rough surface. It has been shown from the traced rays that the diffracted rays dominate over the reflected rays. For the field evaluation, we have used the Fresnel function for the diffracted coefficient and the Fresnel's reflection coefficients. Numerical examples have been carried out for the scattering characteristics of an ocean wave-like rough surface and the delay spared characteristics of a building-like surface. In the present work we have demonstrated that the ray tracing method is effective to numerical analysis of a rough surface scattering.