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Bit Error Rate Measurement of a Measuring System Designed for Superconducting Digital Circuits
Kazuhiro SHIMAOKA Seiichi TOKUNAGA Masaaki NEMOTO Isao YOSHIDA Akira FUJIMAKI Hisao HAYAKAWA
IEICE TRANSACTIONS on Electronics
Publication Date: 2001/01/01
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Superconductive Electronics)
Category: Digital Applications
bit error rate (BER), cryo-cooler, vector network measurement, superconductor, magnetic shield,
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We have developed a measuring system for high-Tc superconducting single-flux quantum circuits and evaluated its performance in terms of bit error rate (BER) measurement for given signal voltage levels. The system includes magnetic shields and a high-frequency test fixture mounted on a closed-cycle cooler. The test fixture is made of non-magnetic material. The transmission characteristics of the measuring system were evaluated by using a vector network analyzer at frequencies ranging from 40 MHz to 20 GHz. The operating temperature of the measuring system ranges from 20 K to room temperature. We connected a 12-GHz wideband pulse amplifier to the system and evaluated its high-speed transmission characteristics. We used a standard 50-Ω microstrip line as an impedance-matched sample. The signal used in the experiment was a 215-1 pseudo random bit signal (PRBS) at 3 Gbps. As a result, the output voltage required for an output driver under the experimental condition was 18.8 mV in order to obtain a resolution of BER measurement of 10-12.