Novel DFT Strategies Using Full/Partial Scan Designs and Test Point Insertion to Reduce Test Application Time

Toshinori HOSOKAWA  Masayoshi YOSHIMURA  Mitsuyasu OHTA  

Publication
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E84-A   No.11   pp.2722-2730
Publication Date: 2001/11/01
Online ISSN: 
DOI: 
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
DFT strategies,  full scan design methods,  partial scan design methods,  test point insertions,  test application time,  

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Summary: 
As LSIs are two-dimensional structures, the number of external pins increases at a lower rate than the corresponding increase in the number of gates on the LSI. Therefore, the number of flip-flops on a scan path increases as the density of gates on LSIs rises, resulting in longer test application times. In this paper, three novel DFT strategies aimed at reducing test application time are proposed. DFT strategy 1 is a full scan design method with test point insertion, DFT strategy 2 is a partial scan design method, and DFT strategy 3 is a partial scan design method with test point insertion. Experimental results show that these DFT strategies reduced the test application times by 45% to 82% compared with conventional full scan design methods.