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Efficient Test Generation Using Redundancy Identification
Sangyoon HAN Sungho KANG
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/09/25
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Fault Tolerance
test pattern generation, redundant faults,
Full Text: PDF(108.2KB)>>
To accomplish an efficient test pattern generation, the isomorphism identification algorithm and the pseudo dominator identification algorithm are developed which are used to identify redundant faults efficiently. Results show that test pattern generation using these algorithms is very efficient.