Efficient Test Generation Using Redundancy Identification

Sangyoon HAN  Sungho KANG  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E83-D   No.9   pp.1814-1815
Publication Date: 2000/09/25
Online ISSN: 
DOI: 
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Fault Tolerance
Keyword: 
test pattern generation,  redundant faults,  

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Summary: 
To accomplish an efficient test pattern generation, the isomorphism identification algorithm and the pseudo dominator identification algorithm are developed which are used to identify redundant faults efficiently. Results show that test pattern generation using these algorithms is very efficient.