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Fault Behavior and Change in Internal Condition of Mixed-Signal Circuits
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/04/25
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Fault Tolerance
CMOS mixed-signal circuits, fault analysis, MOS transistors, operation regions, testing,
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The relationship between the change in transistor operation regions and the fault behavior of a mixed-signal circuit having a bridging fault was investigated. We also discussed determination of transistors to be observed for estimating the fault behavior. These results will be useful for modeling faulty behaviors and analyzing and diagnosing faults in mixed-signal circuits.