Fault Behavior and Change in Internal Condition of Mixed-Signal Circuits

Yukiya MIURA  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E83-D   No.4   pp.943-945
Publication Date: 2000/04/25
Online ISSN: 
DOI: 
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Fault Tolerance
Keyword: 
CMOS mixed-signal circuits,  fault analysis,  MOS transistors,  operation regions,  testing,  

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Summary: 
The relationship between the change in transistor operation regions and the fault behavior of a mixed-signal circuit having a bridging fault was investigated. We also discussed determination of transistors to be observed for estimating the fault behavior. These results will be useful for modeling faulty behaviors and analyzing and diagnosing faults in mixed-signal circuits.