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An IDDQ Sensor Driven by Abnormal IDDQ
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/10/25
Print ISSN: 0916-8532
Type of Manuscript: PAPER
Category: Fault Tolerance
built-in testing, CMOS circuits, IDDQ sensor circuits, IDDQ testing, low-voltage ICs,
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This paper describes a novel IDDQ sensor circuit that is driven by only an abnormal IDDQ. The sensor circuit has relatively high sensitivity and can operate at a low supply voltage. Based on a very simple idea, it requires two additional power supplies. It can operate at either 5-V or 3.3-V VDD with the same design. Simulation results show that it can detect a 16-µA abnormal IDDQ at 3.3-V VDD. This sensor circuit causes a smaller voltage drop and smaller performance penalty in the circuit under test than other ones.