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Local Area Characterization of TTF-TCNQ Evaporated Films by Scanning Probe Microscope
Kazuhiro KUDO Masaaki IIZUKA Shigekazu KUNIYOSHI Kuniaki TANAKA
IEICE TRANSACTIONS on Electronics
Publication Date: 2000/07/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section LETTER (Special Issue on Organic Molecular Electronics for the 21st Century)
Category: Ultra Thin Film
atomic force microscopy, local characterization, TTF, TCNQ, organic films,
Full Text: PDF(1.4MB)>>
We have developed a new type electrical probing system based on an atomic force microscope. This method enables us to measure simultaneously the surface topography and surface potential of thin films containing the crystal grains. The obtained local potential changes give an insight into conduction through the grains and their boundaries.