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Estimation of Current and Voltage Distributions by Scanning Coupling Probe
Satoshi KAZAMA Shinichi SHINOHARA Risaburo SATO
IEICE TRANSACTIONS on Communications
Publication Date: 2000/03/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Recent Progress in Electromagnetic Compatibility Technology)
Category: EMC Measurement and Test
probe, current distribution, voltage distribution, coupling, estimation method, digital IC, microstrip line,
Full Text: PDF(1.8MB)>>
This paper describes a method for estimating current and voltage distributions by scanning with a probe. The method takes advantage of the phenomenon that the coupling between the current and the probe varies with the direction of the probe. The current and voltage are estimated by calculating the probe vector output for each of four directions. Both the current and voltage vector distributions can thus be estimated at the same time by using a single probe. The estimated distributions in a digital IC package and a microstrip line showed that this method produces reliable results. The simple structure of the probe should make it easy to reduce its size.