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OTA-C Based BIST Structure for Analog Circuits
Cheng-Chung HSU Wu-Shiung FENG
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/04/25
Print ISSN: 0916-8508
Type of Manuscript: LETTER
Category: VLSI Design Technology and CAD
built-in self-test (BIST), operational transconductance amplifier (OTA), analog circuit, fault diagnosis, testing,
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In this letter, a novel built-in self-test (BIST) structure based on operational transconductance amplifiers and grounded capacitors (OTA-Cs) for the fault diagnosis of analog circuits is proposed. The proposed analog BIST structure, namely ABIST, can be used to increase the number of test points, sampling and controlling of all test points with voltage data, and making less time for test signal observable. Experimental measurements have been made to verify that the proposed ABIST structure is effective.