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Modeling and Parameter Extraction Technique for Uni-Directional HV MOS Devices
Takao MYONO Eiji NISHIBE Shuichi KIKUCHI Katsuhiko IWATSU Takuya SUZUKI Yoshisato SASAKI Kazuo ITOH Haruo KOBAYASHI
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/03/25
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section of Selected Papers from the 12th Workshop on Circuits and Systems in Karuizawa)
high-voltage MOS, BSIM3, SPICE model,
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This paper presents a new technique for accurately modeling uni-directional High-Voltage lightly-doped- drain MOS (HV MOS) devices by extending the bi- directional HV MOS model and adopting a new parameter extraction method. We have already reported on a SPICE model for bi-directional HV MOS devices based on BSIM3v3. However, if we apply this bi- directional HV MOS model and its parameter extraction technique directly to uni-directional HV MOS devices, there are large discrepancies between the measured and simulated I-V characteristics of the uni- directional devices. This paper extends the bi- directional HV MOS model, and adopts a new parameter extraction technique. Using parameters extracted with the new method, the simulated I-V characteristics of the uni-directional n-channel HV MOS device match the measured results well. Since our method does not change any model equations of BSIM3v3, it can be applied to any SPICE simulator on which the BSIM3v3 model runs.