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A Method of Generating Tests with Linearity Property for Gate Delay Faults in Combinational Circuits
Hiroshi TAKAHASHI Kwame Osei BOATENG Yuzo TAKAMATSU
IEICE TRANSACTIONS on Information and Systems
Publication Date: 1999/11/25
Print ISSN: 0916-8532
Type of Manuscript: PAPER
Category: Fault Tolerant Computing
combinational circuit, marginal chip, gate delay fault, test generation, test with linearity property,
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A. Chatterjee et al. proposed tests with linearity property for gate delay faults to determine, at a required clock speed, whether a circuit under test is a marginal chip or not. The latest transition time at the primary output is changed linearly with the size of the gate delay fault when the proposed test is applied to the circuit under test. To authors' knowledge, no reports on an algorithmic method for generating tests with linearity property have been presented before. In this paper, we propose a method for generating tests with linearity property for gate delay faults. The proposed method introduces a new extended timed calculus to calculate the size of a given gate delay fault that can be propagated to the primary output. The method has been applied to ISCAS benchmark circuits under the unit delay model.