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MeasurementBased Mathematical Active Device Modeling for High Frequency Circuit Simulation
David E. ROOT
Publication
IEICE TRANSACTIONS on Electronics
Vol.E82C
No.6
pp.924936 Publication Date: 1999/06/25
Online ISSN:
DOI:
Print ISSN: 09168516 Type of Manuscript: INVITED PAPER (Special Issue on TCAD for Semiconductor Industries) Category: Keyword: device modeling, largesignal nonlinear, circuit simulation, measurementbased,
Full Text: PDF(458.8KB)>>
Summary:
Measurementbased mathematical modeling is an attractive approach for simulating, accurately and efficiently, circuits based on active devices from a diverse range of constantly evolving processes and technologies. The principle of the measurementbased approach is that it is often most practical to characterize the device with various highfrequency measurements, and then mathematically transform the data to produce predictive device dynamical models for smallsignal (linear) and largesignal (nonlinear) circuit design purposes. There are many mathematical, physical, and measurement considerations, however, that must be incorporated into any sound framework for successful measurementbased modeling. This paper will review some foundations of the subject and discuss some future trends. Review topics include constructing nonlinear constitutive relations from linear data parameterized by operating point and conservation laws including terminal charge conservation and energy conservation. Recent advances and trends will be discussed, such as pulsed IV and pulsed Sparameter characterization with implications for electrothermal and dispersive dynamical models, nonlinear waveform measurements, and the relationship to some blackbox behavioral modeling approaches.

