Transfer Function Matrix Measurement of AWG Multi/Demulti-Plexers

Kazunari HARADA  Kenji SHIMIZU  Nobuhiro SUGANO  Teruhiko KUDOU  Takeshi OZEKI  

IEICE TRANSACTIONS on Electronics   Vol.E82-C   No.2   pp.349-353
Publication Date: 1999/02/25
Online ISSN: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Joint Special Issue on Photonics in Switching: Systems and Devices)
Category: Photonic WDM Devices
wavelength division multiplex,  measurement,  polarization mode dispersion,  eye degradation,  

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Wavelength Division Multiplex (WDM) photonic networks are expected as key for global communication infrastructure. The accurate measurement methods for AWG-MUX/DMUX are desirable for WDM network design. We measured a transfer function matrix of an AWG-MUX to find that polarization mode dispersion (PMD) and polarization dependent loss (PDL) shows the bandpass characteristics, which may limit the maximum size and the bit rate of the system. These bandpass characteristics of PMD and PDL are reproduced by a simple AWG-MUX model: The phase constant difference of 0.5% between orthogonal modes in arrayed waveguides is sufficient to obtain the measured passband characteristics of PMD and PDL. We find phase distribution difference between two orthogonal modes in the arrayed waveguide grating gives arise to complex PMD.