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A Stepwise Refinement Synthesis of Digital Systems for Testability Enhancement
Taewhan KIM Ki-Seok CHUNG C. L. LIU
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1999/06/25
Print ISSN: 0916-8508
Type of Manuscript: PAPER
Category: VLSI Design Technology and CAD
high-level synthesis, testability, scheduling,
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This paper presents a new data path synthesis algorithm which takes into account simultaneously three important design criteria: testability, design area, and total execution time. We define a goodness measure on the testability of a circuit based on three rules of thumb introduced in prior work on synthesis for testability. We then develop a stepwise refinement synthesis algorithm which carries out the scheduling and allocation tasks in an integrated fashion. Experimental results for benchmark and other circuit examples show that we were able to enhance the testability of circuits significantly with very little overheads on design area and execution time.