Device-Deviation Tolerant Elastic-Vt CMOS Circuits with Fine-Grain Power Control Capability

Masayuki MIZUNO  Hitoshi ABIKO  Koichiro FURUTA  Isami SAKAI  Masakazu YAMASHINA  

IEICE TRANSACTIONS on Electronics   Vol.E81-C   No.9   pp.1463-1472
Publication Date: 1998/09/25
Online ISSN: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Novel VLSI Processor Architectures)
low-threshold voltage,  leakage current,  supply-voltage fluctuation,  supply-voltage control,  low power dissipation,  

Full Text: PDF>>
Buy this Article

An elastic-Vt CMOS circuit is proposed which facilitates both high speed and low power consumption at low supply voltages. This circuit permits fine-grain power control on each multiple circuit block composing a chip, and it is not sensitive to design factors as device-parameter deviations or operating-environment variations. It also does not require any such additional fabrication technology as triple-well structure or multi-threshold voltage. The effectiveness of the circuits design was confirmed in applying it to specially fabricated 16-bit adders and 4-kb SRAMs based on 1. 5-V, 0. 35- µm CMOS technology.