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Analyzing and Reducing the Impact of Shorter Data Retention Time on the Performance of Merged DRAM/Logic LSIs
Koji KAI Akihiko INOUE Taku OHSAWA Kazuaki MURAKAMI
IEICE TRANSACTIONS on Electronics
Publication Date: 1998/09/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Novel VLSI Processor Architectures)
merged DRAM/logic LSIs, data retention time, refresh, yield,
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In merged DRAM/logic LSIs, the DRAM portion could suffer from shorter data retention time because of heat and noise caused by the logic portion. In order to reconsider the DRAM data retention characteristics, this paper formulates and evaluates the performance degradation due to conflicts between normal DRAM accesses and refresh operations. Next, this paper proposes a new DRAM refresh architecture which intends to reduce unnecessary refreshes. This architecture exploits multiple refresh periods. Each row is refreshed with the most appropriate period of them. Reducing the number of refreshes improves the accessibility to DRAM. It is shown that the method reduces the number of refreshes and the degree of the performance degradation of the logic portion.